Advanced Engineering Materials has published an article by Krapf et Al about their research of a “new experimental workflow combining standalone bulge cyclic testing with intermittent high-resolution imaging by transmission electron microscopy (TEM) at specific positions of interest”, with a view to combating the fact that bulge testing is only possible in limited experimental configurations.
The abstract concludes “the presented setup can be used with a number of TEM-based characterization techniques and has the potential to reveal cyclic deformation mechanisms in several thin film systems”.
Silson’s silicon nitride membranes of frame size 12.5 x 12.5 mm and thickness 525μm and membrane size 1 x 4 mm and thickness 100 nm were used to fabricate the freestanding gold thin films used for this study.
Follow this link to read the full paper!