Nanoscale Surface and Bulk Electronic Properties of Ti3C2Tx MXene Unraveled by Multimodal X-Ray Spectromicroscopy

Small Methods has published an article by Amargianou et Al which uses scanning X-ray microscopy (SXM) to analyse the surface and bulk electronic properties of Ti3C2Tx MXene on the nanoscale.

Silson’s silicon nitride membranes were used for the SXM imaging, (both transmission and TEY experiments). The membrane size was 1 mm × 1 mm with a thickness of 100 nm, and the Si frame size was 5 mm × 5 mm with a thickness of 200 µm.

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