Visualization of local deformations in suspended few-layer graphene

An article was published in March 2021 by Applied Physics Letters titled: “Direct visualization of local deformations in suspended few-layer graphene membranes by coupled in situ atomic force and scanning electron microscopy”.

Silson membranes with holes were used to analyse graphene using a coupled in-situ AFM-SEM system, the paper reads: “As a model 2D membrane, we use mechanically exfoliated few-layer graphene flakes (5 layers) transferred onto holey silicon carrier chips with single central holes (custom made from Silson Ltd., UK)”

Here is the link to the full paper!